4 article(s) from Sugawara, Yasuhiro
High–low Kelvin probe force spectroscopy for measuring the interface state density
- Ryo Izumi,
- Masato Miyazaki,
- Yan Jun Li and
- Yasuhiro Sugawara
Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18
Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy
- Masato Miyazaki,
- Yasuhiro Sugawara and
- Yan Jun Li
Beilstein J. Nanotechnol. 2022, 13, 712–720, doi:10.3762/bjnano.13.63
Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy
- Tatsuya Yamamoto,
- Ryo Izumi,
- Kazushi Miki,
- Takahiro Yamasaki,
- Yasuhiro Sugawara and
- Yan Jun Li
Beilstein J. Nanotechnol. 2020, 11, 1750–1756, doi:10.3762/bjnano.11.157
Imaging the surface potential at the steps on the rutile TiO2(110) surface by Kelvin probe force microscopy
- Masato Miyazaki,
- Huan Fei Wen,
- Quanzhen Zhang,
- Yuuki Adachi,
- Jan Brndiar,
- Ivan Štich,
- Yan Jun Li and
- Yasuhiro Sugawara
Beilstein J. Nanotechnol. 2019, 10, 1228–1236, doi:10.3762/bjnano.10.122
![[Graphic 16]](/bjnano/content/inline/2190-4286-10-122-i16.svg?max-width=637&scale=1.18182)
and ![[Graphic 17]](/bjnano/content/inline/2190-4286-10-122-i17.svg?max-width=637&scale=1.18182)
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![[Graphic 38]](/bjnano/content/inline/2190-4286-10-122-i38.svg?max-width=637&scale=1.18182)
and ![[Graphic 39]](/bjnano/content/inline/2190-4286-10-122-i39.svg?max-width=637&scale=1.18182)
steps. (a) Topographic image...
![[Graphic 72]](/bjnano/content/inline/2190-4286-10-122-i72.svg?max-width=637&scale=1.18182)
, b) ![[Graphic 73]](/bjnano/content/inline/2190-4286-10-122-i73.svg?max-width=637&scale=1.18182)
, c) reduced ![[Graphic 74]](/bjnano/content/inline/2190-4286-10-122-i74.svg?max-width=637&scale=1.18182)
, and d) ![[Graphic 75]](/bjnano/content/inline/2190-4286-10-122-i75.svg?max-width=637&scale=1.18182)
steps. B...
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